The 2008 National Instruments Technical Symposium was designed to help engineers stay competitive and up-to-date on the latest technologies in design, test and control. Following are presentations from the conference.

• Keynote - Parallel Technologies for a New Generation of Applications
• Building Video and Audio Test Systems
• Ethernet-Based Industrial Communication Protocols -Connect LabVIEW to PLCs
• Five Tips for Reducing Measurement Noise
• The Full Spectrum of NI Sound and Vibration Measurements
• How to Improve Your PID Controller
• Identifying the Ideal Digital I/O Hardware for High-Speed Applications
• Implementing Hardware-in-the-Loop (HIL) Test Systems with LabVIEW
• Introduction to New LabVIEW Real-Time Control Features for CompactRIO
• Introduction to the LabVIEW FPGA Module
• Introduction to the NI LabVIEW Statechart Module
• Machine Condition Monitoring
• Medical Device Design: Shorten Prototype and Deployment Time with NI Tools
• New Features in Vision Builder for Automated Inspection
• Optimizing Automated Test Systems with Parallel Technologies
• Optimizing Your PXI System for the Long Haul
• Raw Data to Results: Proper Data Management Techniques
• Revolutionize Electronics Education in Your Classroom with NI Multisim, NI ELVIS II, and NI LabVIEW
• RF Record and Playback: Applications and Technology
• Rookie's Guide to Sound and Vibration
• Simple. Secure. Wi-Fi DAQ.
• Software Engineering for LabVIEW Applications
• Techniques for Architecting Hybrid Test Systems
• Time-Based Synchronization Techniques
• Top Considerations for High-Channel-Count Measurement Systems: An In-Depth Look at Timing and Synchronization
• Trends in Wireless Drive Software-Defined Test: Optimizing Performance of Software-Defined Instruments
• What's New in LabVIEW 8.6

Hands-On Presentations

• Automated Test Software Hands-On Seminar
• CompactRIO FPGA Hands-On Seminar
• CompactRIO Hands-On:Programming with LabVIEW Real-Time
• Hands-On: New NI Single-Board RIO
• Introduction to LabVIEW 8.6
• NI Smart Camera Hands-On