RF Integrated Circuit (RFIC) Test

With more wireless technologies and demands for shorter time-to-market, engineers need a faster and more flexible approach that reduces development and test costs for testing RFICs.

National Instruments can help you plan for the future using our modular, software-defined approach to RFIC test

NI Expertise Overview

The demands of emerging wireless standards such as LTE Advanced Pro, 5G, and 802.11ax are creating new test challenges for today's engineers. These standards—in addition to emerging technologies such as envelope tracking (ET) and digital predistortion (DPD)—make it even more difficult to reduce test times and increase throughput without sacrificing accuracy or increasing cost. NI PXI-based test solutions combine RF measurements with mixed-signal instrumentation to provide a complete solution for high volume production test of RF power amplifiers (PAs), RF front end (RFFE) modules, transceivers, and integrated modules. NI PXI solutions can serve test needs from characterization through final manufacturing test, reducing the cost of test and time to market.

Featured Content

TriQuint Semiconductor improves RF power amplifier test throughput with National Instruments PXI Test Systems
Configure a PXI test system for enveleope tracking (ET) PA testing
The National Instruments Semiconductor Test System (STS) provides production-ready test capabilities for RF power amplifiers, transceivers, and front end modules. 

Products and Solutions

The NI Alliance Partner Network

The Alliance Partner Network includes more than 950 companies that specialize in complete solutions. From products and systems to integration, consulting, and training services, NI Alliance Partners are uniquely equipped and skilled to help solve some of the toughest engineering challenges.

Application Resource Kit


Overcome Common Test Challenges with PXI

The rapid evolution of wireless connectivity has driven the continual consumer thirst for more data throughput and reduced time to market. Learn about test challenges and how NI PXI instrumentation is meeting these demands in both characterization and production test environments.