RF Integrated Circuit (RFIC) Test
With more wireless technologies and demands for shorter time-to-market, engineers need a faster and more flexible approach that reduces development and test costs for testing RFICs.
The demands of emerging wireless standards such as LTE Advanced Pro, 5G, and 802.11ax are creating new test challenges for today's engineers. These standards—in addition to emerging technologies such as envelope tracking (ET) and digital predistortion (DPD)—make it even more difficult to reduce test times and increase throughput without sacrificing accuracy or increasing cost. NI PXI-based test solutions combine RF measurements with mixed-signal instrumentation to provide a complete solution for high volume production test of RF power amplifiers (PAs), RF front end (RFFE) modules, transceivers, and integrated modules. NI PXI solutions can serve test needs from characterization through final manufacturing test, reducing the cost of test and time to market.