Semiconductor technology requirements often outpace the test coverage that traditional ATE provides for analog, mixed-signal, and RF test. Semiconductor test engineers need scalable solutions that address cost, design, and device challenges.
A platform-based approach from characterization to production offers cost-optimized, high-performance test solutions for RF and mixed-signal test.
NI semiconductor test customers report 10X improvement in test times while maintaining measurement and performance requirements.
NI products deliver industry-leading measurement accuracy supported through calibration and system services to ensure long-term performance.