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"The new test automation platform built on NI TestStand and LabVIEW helped us reduce the time necessary to validate an RFIC from two months to three weeks."
PXI RF instrumentation from National Instruments provides a fast, flexible, and accurate solution to RF integrated circuit (RFIC) test. From discrete components such as attenuators and amplifiers to integrated systems on a chip (SOCs), engineers can realize a significant reduction in overall test costs. Today, many leading semiconductor companies have adopted PXI to test RFICs ranging from power amplifiers (PAs) to fully integrated SOCs in both the design validation and manufacturing production test.
National Instruments hardware and software products have the following measurement capabilities:
- Adjacent Channel Power (ACP)
- Complementary Cumulative Density Function (CCDF)
- Channel Power (CHP)
- Intermodulation Distortion (IM3)
- Occupied Bandwidth (OBW)
- Spectral Emissions (SEM)