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"The new test automation platform built on NI TestStand and LabVIEW helped us reduce the time necessary to validate an RFIC from two months to three weeks."
- Sylvain
Bertrand
- ST-Ericsson
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PXI RF instrumentation from National Instruments provides a fast, flexible, and accurate solution to RF integrated circuit (RFIC) test. From discrete components such as attenuators and amplifiers to integrated systems on a chip (SOCs), engineers can realize a significant reduction in overall test costs. Today, many leading semiconductor companies have adopted PXI to test RFICs ranging from power amplifiers (PAs) to fully integrated SOCs in both the design validation and manufacturing production test.
National Instruments hardware and software products have the following measurement capabilities:
- Adjacent Channel Power (ACP)
- Complementary Cumulative Density Function (CCDF)
- Channel Power (CHP)
- Intermodulation Distortion (IM3)
- Occupied Bandwidth (OBW)
- Spectral Emissions (SEM)
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Wireless IC (RFIC) Test System
Test and characterize the performance of various wireless ICs, including power amplifiers, transceivers, and other RF integrated circuits (RFICs) with the following PXI system.
- 6.6 GHz vector signal analyzer (VSA) and vector signal generator (VSG) for common RF standards
- Flexible software for multiple modulation schemes
- Source/measure capability from +/- 100 V, down to 10 pA of resolution
- Up to 200 MHz digital I/O for protocols and control lines
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WiMAX Testing
Software-defined PXI test systems can be combined with the NI Measurement Suite for fixed WiMAX measurements. System features include the following:
- Support for IEEE 802.16-2004 OFDMA signal types
- Typical error vector magnitude (EVM) of -45 dB at 2.5 GHz
- Flexible subframe and burst configurations
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Automated Wireless LAN Test System
Perform automated wireless local area network (WLAN) WLAN measurements 5 to 10 times faster using PXI instrumentation. Product features include the following:
- Analyzer typical error vector magnitude (EVM) of < -40 dB
- Measurements for IEEE 802.11a/b/g/n
- EVM and spectral mask measurements in less than 8 ms
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RF Systems Integrators
View the following system integrators in the NI Alliance Member Directory if you're interested in a custom RF test solution.
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