NI TestStand 2016 Semiconductor Module f4 Patch Details

Publish Date: Jan 17, 2018 | 0 Ratings | 0.00 out of 5 | Print

The NI TestStand 2016 Semiconductor Module f4 patch resolves the issues outlined in the table below. This installer includes all TSM 2016 components, so it's not necessary to install TSM 2016 before installing this patch. National Instruments recommends this patch for all applications using TSM 2016. You download it directly through the following Downloads page: 

TestStand 2016 Semiconductor Module f4 Patch (32-bit) 
TestStand 2016 Semiconductor Module f4 Patch (64-bit) 

ID Description
679251 DUTs that produced a run-time error during testing appeared as passed in STDF file, but were appropriately binned.
600508 The TestStand Semiconductor Module fails to call the LabVIEW event callback for the ErrorOccurred event.
598494 Some legacy digital example LabVIEW VIs are not saved in the correct version of LabVIEW.
611229 If you view the per site inputs panel of a Semiconductor Action step followed by a MultiTest step (or vice versa), an error dialog appears.
626657 If a code module executes on all sites because the subsystem includes all sites or because the "One thread only" setting is enabled and the sites in the Semiconductor Module context are not in numerical order, the Set Site Data VI stores the site data incorrectly.
563825 NI_TestStand_Semiconductor_Module.lvlibp was rebuilt to address LabVIEW CAR 563825, which can cause LabVIEW 2014 SP1 64-bit to crash in rare circumstances.
630043 The Extract Pin Data VI can return incorrect values when using the Parametric:1D Array polymorphic instance



What's New
The Standard Test Data Format (STDF) Log result processing plug in now generates summary records for the Hardware Bin Record (HBR), Software Bin Record (SBR), Test Synopsis Record (TSR), and Part Count Record (PCR) records. The records are included at the end of the STDF log file and have a HEAD_NUM value of 255 to indicate that they are summary records.

  • New comments to the NI_SemiconductorModule_StandardLotSettings and NI_SemiconductorModule_StandardStationSettings data types indicate where each property is stored in the STDF log file. 

    Note: As a result of this change, two Type Conflict dialog boxes launch when you launch the TestStand Sequence Editor after you install this patch. To resolve the type conflicts, select the "Use Currently Loaded Type" option for both type conflicts to use the version of the data type stored in the NI_SemiconductorModule_Types.ini type palette.

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