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Power Management ICs (PMICs) Testing

"With our new platform based on NIs PXI technologies, we’ve maintained both measurement and performance integrity while achieving three times cost reduction and 10 times improvement in semiconductor validation throughput."

- Ray Morgan - ON Semiconductor

Read the full case study

National Instruments supplies a variety of products for designing PMIC test solutions for validation, characterization, and production environments. Learn how you can use PXI and modular instrumentation combined with flexible software such as NI LabVIEW to reduce test costs and improve measurement repeatability. Use the resources (customer case studies, technical tutorials, and example code) on this site to learn how PXI and LabVIEW can help you test your PMIC.

National Instruments hardware and software products have the following measurement capabilities:

- Power supply rejection ratio (PSRR)

- Source/measure current and voltage on device pins (VCC, ICC, IBST, DRVH, DRVL, and so on)

- Line/load regulation transient tests

- Power converter efficiency (quiescent and shutdown current)

- Fast IV curve tracing


National Instruments modular hardware and graphical software tools can help decrease the cost and increase the flexibility of PMIC test systems.

Learn how to use National Instruments tools to build a customized PMIC test system that meets your needs. The following technical tutorials explain key strategies for architecting your test system, combined with proven example code written by National Instruments system engineers. These resources are designed to help you get started testing various chip parameters including power consumption, quiescent and gross current draw, and voltage levels.

Semiconductor Test PMIC Resource Kit
Download the set of technical tutorials for Power Management ICs that are listed on this page.

Download the technical tutorials and example code to your desktop

PMIC Test System for PXI

Test and characterize the performance of PMICs including DC-DC converters, low-dropout (LDO) linear voltage regulators, and display drivers with the following PXI system.

  • Source/measure capability from +/- 100V, down to 10 pA of resolution
  • 100 MS/s, 14-bit real-time, up to 2.0 GS/s equivalent-time sampling
  • 24-bit resolution up to 500 kS/s, ranging to 16 bits at 15 MS/s for generation
  • Up to 200 MHz digital I/O for I2C, SPI, and other communication protocols

View the test system

Learn More about National Instruments Alliance Partners

Learn about Alliance Partners and integrators that National Instruments works with directly to provide services and support for testing PMICs.

Search the Alliance Partner Directory

Industry Trends

  • Lower output voltage levels and quiescent current draw
  • Faster response times for abrupt changes in load current
  • Government legislation to increase power efficiencies
  • Growth that is outpacing general semiconductor industry by 2x

Benefits of Using NI

NI offers a modular platform to allow for multiple power supplies at various voltage levels, current sensitivity down to 10 pA, and a small footprint and tight integration between instruments in PXI.


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