NIWeek brings together more than 3,000 engineers and scientists for technical networking, interactive sessions, targeted industry summits, hands-on workshops, exhibitions, and keynote presentations from leading technology thought leaders.

RF and Wireless Summit - Tuesday & Wednesday, August 7 & 8

Learn how National Instruments is redefining RF and wireless test and hear from RF, microwave, and wireless industry experts as they explain the latest trends, emerging technologies, and test techniques at the RF and Wireless Test Summit. Technologies discussed will include RF-RIO, FPGA signal processing, MIMO, advanced network analysis, microwave system simulation, and microwave frequency synthesis.

Who Should Attend

Engineers, Scientists, Researchers, Professors, Industry Experts, Test Managers, and Students

Technical Sessions

LabVIEW FPGA for RF Test and Measurement Applications
Many RF applications require significant processing, which is traditionally accomplished with microprocessors. By adding user-programmable FPGAs into these systems, you can dramatically reduce test times and increase overall measurement performance. At this session, see a demonstratration of novel RF test techniques implemented in LabVIEW FPGA.

The Art of Amplifier Modeling and Design Optimization With an Active Load-Pull System

Nonlinear device instrumentation is largely based on evolved vector network analyzers that are extended by a load-pull system and directly address the need for rapid and accurate data. The resulting measurements do not capture the entire nonlinear response of a device and require in simulators "an interpretation" through a nonlinear model, which often introduces differences between actual and simulated circuit performance. Learn about the new opportunities emerging from instruments capable of measuring current and voltage waveforms as well as the shaping of these waveforms through harmonic source- and load-pull systems.

A PXI-Based Test System Implementation for Radio Base Station Unit Testing

Today's base station production must overcome the challenges of test time, floor space, and total system cost. Discover how Gefle Testteknik met these challenges with the smaller size, parallel processing, and system-calibration features of PXI.

Proving the Efficiencies of a Wireless Two-Way Relay System

Relaying is opening new possibilities for improving spectral efficiency in wireless networks. Hear how Texas A&M University researchers used NI FlexRIO and LabVIEW to create a real-time prototype of a two-way relay system with analog network coding. Also explore how to meet the challenges of implementing channel estimation, synchronization, and TDD operation in real time with LabVIEW FPGA.

Cleaning Up Dirty RF: Rapid Prototyping With NI USRP and LabVIEW

Learn how the NI USRP™ software defined radio and LabVIEW was used to develop and test improved methods for digitally correcting analog RF impairments using digital signal processing techniques. Also see how to migrate .m file simulations into LabVIEW using a graphical system design approach to address nonlinear amplifier impairments and validate algorithms with real-world RF signals.

Software Defined Radio Experts Panel

Flexible software defined radio (SDR) solutions have emerged as the platform of choice for rapidly prototyping wireless communications systems. During this panel session, hear some of the world's leading SDR experts discuss the future challenges of prototyping RF and communications systems as bandwidths, wireless demands, and complexity grow at an exponential rate.

Simulating Complex DSP Algorithms to Test Real-Time Broadband Data

Discover how Averna used NI FlexRIO and NI RF tools to simulate real-world conditions and verify the design of consumer broadband equipment. Explore the digital signal processing (DSP) techniques used as well as how to develop the algorithm for the FPGA, verify the accuracy on the host, and provide signal impairments while meeting low-latency requirements.

AWR and NI: Enabling Microwave Education and Biomedical Research Through Integrated Solutions

Explore a Texas Tech microwave engineering course for which students designed, laid out, and simulated their circuits in the industry-standard microwave design tool, AWR Design Environment; created a test bench in NI LabVIEW; and took measurements with PXI RF instruments. Learn how these tools were applied to a tumor tracking radar system for lung cancer radiotherapy.

Coexistence Testing for Wireless Medical Devices

RF wireless technologies are increasingly used in medical devices, especially for products in the license-free RF spectrum, including the industrial, scientific, and medical bands. Understanding RF spectrum sharing (wireless coexistence) is important in designing and verifying a medical device. At this session, explore wireless coexistence test for wireless-based medical devices using NI tools.

BER, EVM, and Digital Modulation Testing for Test and Product Engineers

System-level testing is growing more popular and stands to overtake parametric testing as the standard in high-volume production test. At this session, explore several over-the-air system-level tests such as bit error rate (BER) and error vector magnitude (EVM) that are used in a high-volume manufacturing environment.

RF Power Amp Testing With NI Products

The importance of optimized test time, capital cost control, and a standardized test methodology cannot be overemphasized in semiconductor testing. Learn how this is particularly true in testing power amplifiers for mobile devices that support multiple modulation standards.

Beyond S-Parameters: In Search of a Behavioral Model for Nonlinear Components

For passive or active components used in their linear mode of operation, S-parameters can be regarded as a measurement-based small-signal behavioral model of the device under test (DUT) However, there is not a uniform approach for dealing with nonlinear RF and microwave systems This session describes this challenge, the NMDG "S-functions" measurement-based behavioral model, and how this model can be used to accurately predict harmonic and modulation behavior of cascaded, nonlinear components.

 

 

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