NIWeek 2010, the world's leading graphical system design conference and exhibition, brings together the engineering, academic, and industrial communities for three full days of interactive technical sessions, exhibitions, and workshops on the latest technologies for control design, measurement, automation, manufacturing, and test. Discover how graphical system design empowers the development of more efficient applications to measure and fix the world around us.
Join key decision makers, developers, and visionaries to learn about trends and advancements in the measurement and automation world. NIWeek is the ultimate learning environment, connecting both our novice and expert users for three days of interactive technical sessions, hands-on workshops, case study presentations, and panel discussions on the latest advancements in design, control, automation, manufacturing, and test. The event also is the perfect opportunity for attendees to network with leading engineers and scientists share best practices and example code with fellow developers, and exchange information with National Instruments product managers.
At NIWeek 2010 you can:
- Network with more than 3,000 engineers, scientists, educators, and NI developers
- Choose from 200 advanced technical presentations, hands-on workshops, case studies, and panel discussions
- Learn about creating advanced test, control, and design solutions in daily keynotes
- Improve your National Instruments LabVIEW knowledge
- Connect to the NI LabVIEW community
- Discover new products and solutions in more than 200 exhibitor booths and pavilions
