NI News from National Instruments Your Global, Customized Source for Company and Product News, Events, and Support Top Stories -------------------------------------------- National Instruments 2005 Product Catalog Now Available http://digital.ni.com/express.nsf/bycode/nn1204bT1 Taking Data Acquisition to the Limit with USB http://digital.ni.com/express.nsf/bycode/nn1204bT2 In This Issue -------------------------------------------- Company and Product News-- 1. NI Embedded System Modules Offer Higher Accuracy, Speed, and Density 2. Kodak Improves Image Quality with NI LabVIEW 3. Tutorial: Using Real-Time Applications with the Timed Loop 4. Developing Highly Reliable Test Systems with LabVIEW 5. Decrease Data Acquisition System Setup Time with Sensors Plug&Play 6. Improve Sensor Measurement Accuracy by 10X with NI Signal Conditioning 7. Five New Low-Cost Digital I/O Boards Feature 37-Pin Connectivity 8. NI Extends PXI for High-Channel-Count Data Logging 9. Proven C Development Continues with LabWindows/CVI 7.1 10. Building Custom I/O with Xilinx FPGAs and NI LabVIEW Events-- 1. Make the Most of Data Acquisition with LabVIEW 2. Building Handheld Measurement Devices with LabVIEW 3. Precision Analog Measurements 101 Support-- 1. NI Measurement Fundamentals Tutorial Series 2. I2C Implementation in LabVIEW FPGA 3. Migrating an Application from E Series to M Series DAQ Devices 4. Developing High-Speed Continuous Buffered Data Acquisition Applications with CompactRIO 5. Event-Driven Circular Hard Disk Data Buffering 6. Understanding Client-Server Applications 7. LabWindows/CVI 7.1: Increased Integration and Productivity for ANSI C Developers 8. What Are Switching Configurations? Company and Product News -------------------------------------------- 1. NI Embedded System Modules Offer Higher Accuracy, Speed, and Density Six new embedded system modules expand the I/O capabilities of the NI CompactRIO reconfigurable embedded platform for industrial vibration monitoring and control. With the new modules, you now can perform high-fidelity acoustic and vibration measurements, achieve analog input sampling rates up to 800 kS/s, acquire industrial voltage signals up to ±60 V, and use 32-channel modules to extend the channel density of CompactRIO systems. http://digital.ni.com/express.nsf/bycode/nn1204b01 2. Kodak Improves Image Quality with NI LabVIEW Eastman Kodak Company uses NI LabVIEW and NI vision software to perform image quality analysis for a variety of Kodak products, including digital cameras, printers, and scanners. With these NI software tools, Kodak improves product designs by consistently measuring image quality throughout the design process. Kodak then uses the software during the manufacturing process to verify that assembled imaging products meet Kodak’s high image-quality standards. http://digital.ni.com/express.nsf/bycode/nn1204b02 3. Tutorial: Using Real-Time Applications with the Timed Loop Through this technical online tutorial, learn how to develop advanced real-time applications with the LabVIEW timed loop and discover how to implement deterministic multirate scheduling, microsecond timing, and hardware event response. http://digital.ni.com/express.nsf/bycode/nn1204b09 4. Developing Highly Reliable Test Systems with LabVIEW Imagine walking into your office one morning and discovering that the PC running your month-long durability test has crashed. Despite the shortcomings of general-purpose operating systems like these, you can successfully use NI LabVIEW to develop highly reliable test systems for the majority of applications. http://digital.ni.com/express.nsf/bycode/nn1204b04 5. Decrease Data Acquisition System Setup Time with Sensors Plug&Play Learn how Sensors Plug&Play is revolutionizing sensor measurements by helping your data acquisition system detect and automatically configure sensors. http://digital.ni.com/express.nsf/bycode/nn1204b05 6. Improve Sensor Measurement Accuracy by 10X with NI Signal Conditioning Try out this interactive National Instruments signal conditioning demo to find out how signal conditioning can improve your sensor measurement accuracy by up to 10X. http://digital.ni.com/express.nsf/bycode/nn1204b06 7. Five New Low-Cost Digital I/O Boards Feature 37-Pin Connectivity Five new NI digital I/O boards offer superior ease of use and deterministic performance at a low cost for industrial measurement and control and OEM applications. At just $250 USD each, these new boards deliver NI-DAQmx software technology for Windows and NI LabVIEW Real-Time, as well as a high-reliability industrial feature set and a 37-pin subminiature-D on their front panels for easy connectivity with low-cost accessories. http://digital.ni.com/express.nsf/bycode/nn1204b07 8. NI Extends PXI for High-Channel-Count Data Logging You now can use the PXI platform to create high-density data-logging and channel-scanning applications. The new NI high-density PXI switch module can multiplex more than 3,000 channels to a single digital multimeter in one 3U PXI chassis, making it ideal for data-logging applications in automotive, aerospace, and consumer electronics test. http://digital.ni.com/express.nsf/bycode/nn1204b03 9. Proven C Development Continues with LabWindows/CVI 7.1 With the latest release of NI LabWindows/CVI, C developers can continue to use their existing code to develop test and measurement applications faster. LabWindows/CVI 7.1 introduces expanded integration across the NI platform, increased design-time and run-time productivity, and new user interface controls. http://digital.ni.com/express.nsf/bycode/nn1204b10 10. Building Custom I/O with Xilinx FPGAs and NI LabVIEW During the last year, NI and Xilinx have collaborated to bring the flexibility and performance of FPGAs to customers for ultimate programmability control and measurement I/O. This article discusses how NI LabVIEW and Xilinx Virtex-II use FPGA technology so you can build state-of-the-art custom instrumentation. http://digital.ni.com/express.nsf/bycode/nn1204b08 Events -------------------------------------------- 1. Make the Most of Data Acquisition with LabVIEW Get the most out of M Series DAQ technologies using LabVIEW and NI-DAQmx. This event begins with a discussion on how to reduce total system costs during application configuration and development. You also learn how to apply these cost-reduction principles using LabVIEW and NI-DAQmx to synchronize I/O tasks as well as how to use the IEEE 1451.4 TEDS (Transducer Electronic Data Sheet) standard for smart sensors. http://digital.ni.com/express.nsf/bycode/nn1204b11 2. Building Handheld Measurement Devices with LabVIEW Build a handheld applications specifically designed to fit your needs. This video demonstrates how you can create a flexible and portable data acquisition system that includes advanced functionality such as data-logging, analysis, and wireless communication with host PCs. http://digital.ni.com/express.nsf/bycode/nn1204b12 3. Precision Analog Measurements 101 Attend this 45-minute Web Event on Demand video to learn the fundamentals you need to achieve remarkable throughput rates while maintaining precision and stable measurement accuracy up to 23 bits. This introduction shows you how to attain optimal performance while reducing test system size and cost. http://digital.ni.com/express.nsf/bycode/nn1204b13 Support -------------------------------------------- 1. NI Measurement Fundamentals Tutorial Series The NI Measurement Fundamentals Series consists of a collection of tutorials that covers topics that are commonly used in measurement applications. These tutorials are not specific to certain products; they explain general concepts that apply to a wide range of applications. http://digital.ni.com/express.nsf/bycode/nn1204b14 2. I2C Implementation in LabVIEW FPGA I2C is a common communication protocol used in board-level design for communication between processor and peripheral chips and components. These examples are an implementation of a generic I2C communication master and a chip-specific communication application. http://digital.ni.com/express.nsf/bycode/nn1204b15 3. Migrating an Application from E Series to M Series DAQ Devices This document highlights some of the main differences that you should keep in mind when moving an application from National Instruments E Series to M Series DAQ devices. http://digital.ni.com/express.nsf/bycode/nn1204b16 4. Developing High-Speed Continuous Buffered Data Acquisition Applications with CompactRIO This article and example program discuss your options for developing high-speed data acquisition applications using built-in functions in the LabVIEW FPGA Module to buffer data in the FPGA memory space and transfer it to a real-time or Windows host processor without loss. http://digital.ni.com/express.nsf/bycode/nn1204b17 5. Event-Driven Circular Hard Disk Data Buffering For engineers who build event-driven, high-channel-count data-logging systems, hard disk-based circular buffers allow the system to log a comprehensive data set. Unlike conventional RAM buffering, circular hard disk buffers support very long data records that can extend for minutes before and after the event. http://digital.ni.com/express.nsf/bycode/nn1204b18 6. Understanding Client-Server Applications Learn the basics of client-server applications and how to develop them. We discuss the fundamentals of client-server applications, and explore a simple temperature monitoring application to help you understand what you need to consider when creating a client-server application. http://digital.ni.com/express.nsf/bycode/nn1204b19 7. LabWindows/CVI 7.1: Increased Integration and Productivity for ANSI C Developers LabWindows/CVI 7.1 streamlines development with hardware configuration assistants, comprehensive debugging tools, and interactive execution capabilities developers can use to run functions at design time. Using built-in measurement libraries, developers can rapidly develop complex applications, such as multithreaded programs and ActiveX server/client programs. With the flexibility of the LabWindows/CVI environment, developers can optimize the data acquisition, analysis, and presentation components of their test and measurement applications. http://digital.ni.com/express.nsf/bycode/nn1204b20 8. What Are Switching Configurations? Switches play a large part in expanding instrumentation channel count or increasing system measurement flexibility. For example, you can easily create a data-logging application with 100 channels using one digital multimeter (DMM) and a 100x1 multiplexer to the DMM -- this is much simpler and more cost-effective than purchasing 100 DMMs. However, you may find switch configuration choices challenging if you do not have some background on the topology types available. There are advantages and disadvantages to using each type of configuration in your automated test system. http://digital.ni.com/express.nsf/bycode/nn1204b21 NI News is customized to your product, industry, and content subscription preferences. 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