| Issue at a Glance | |
|
|
| Company and Product News | |
|
|
| • | NI Introduces New Online LabVIEW Tools Network |
| • | Dell Senior VP Jeff Clarke to Deliver NIWeek 2005 Keynote |
|
|
| Events | |
|
|
| • | Step-By-Step Data Acquisition |
| • | Tutorial - Digital Multimeter Measurement |
|
|
 |
|
| Of Recent Interest | |
|
|
| • | Windowing: Optimizing FFTs Using Window Functions |
| • | Find Events in Your Area |
|
|
|
| View NI News Archives |
|
| Local Sales Contact Info |
|
| Travis Ferguson Tel: (512) 683-0100 Fax: (512) 683-9411 travis.ferguson@ni.com |
Additional Local Contacts |
|
 |
|
|
Subscription Preferences NI News is customized to your product, industry, and content subscription preferences.  |
Learn more.
Learn more.
NI Introduces New Online LabVIEW Tools Network
The new National Instruments LabVIEW Tools Network is the industry's largest source for information on LabVIEW add-on and connectivity tools. Through this portal, LabVIEW users have access to thousands of tools compatible with LabVIEW, such as add-on software products, hardware drivers, books, product advisors and training materials from more than 100 companies.
Learn more.
Dell Senior VP Jeff Clarke to Deliver NIWeek 2005 Keynote
Jeff Clarke, senior vice president of Dell, Inc., will deliver the closing keynote address to more than 2,000 attendees at National Instruments NIWeek 2005, the world's leading virtual instrumentation conference. Clarke will address the role of industry standards in the evolution of enterprise computing.
Learn more.
Development Resources
Learn to Acquire, Analyze, and Present with NI LabVIEW
Download this resource kit, packed with application notes, Web Events on Demand and more, to learn more about data acquisition, measurement analysis, and data presentation using National Instruments LabVIEW, a powerful graphical development environment that gives you the flexibility of a programming language without the complexity of traditional development tools.
Get more information and download the kit.
Tutorial - PXI and How It Benefits Measurement Applications
PXI (PCI eXtensions for Instrumentation) is a rugged PC-based platform for measurement and automation systems. View this tutorial to obtain a PXI overview, including PXI hardware and software architecture information, as well as an introduction to PXI system configuration.
Take this tutorial.
NI Launches New Instrument Control Resource Page
This new Web site features resources on connecting to your instruments through any bus using any programming language. Read valuable white papers, download instrument drivers, view Web events and product demos, and obtain specific product information for a variety of application and I/O software, I/O bus hardware, and instrumentation hardware.
View the page.
Execution Tracing of NI LabVIEW Real-Time Systems
The National Instruments LabVIEW Execution Trace Toolkit, an add-on for the LabVIEW Real-Time Module, offers advanced debugging and benchmarking of applications running on LabVIEW Real-Time targets. Using this toolkit, you can access detailed information about application performance to quickly identify sources of jitter, such as memory allocation and race conditions.
View a multimedia demo and get the toolkit.
NI Streamlines the Mechanical Design Process
Using NI INSIGHT from National Instruments, you now can map test data onto a 3D CAD model and then conduct a 3D comparison with test analysis results to identify trouble spots in your designs and correct them before production. View demonstrations of this process.
Learn more and view multimedia demos.
Events
Step-By-Step Data Acquisition
This three-part Web event series will takes you step-by-step from system specification and setup to software development and testing. During each Web event, see product demonstrations and gain hands-on experience by downloading and following the exercise scripts after each session.
Get started.
Tutorial - Digital Multimeter Measurement
Learn how to use a digital multimeter (DMM) to build accurate measurement systems. Explore various DMM capabilities such as AC and DC voltage and current, resistance, capacitance/inductance, and frequency/period measurements. Explore more quality technical content and audiovisual tutorials covering analog, digital, sensor, and instrument topics at ni.com/measurementfundamentals.
Take this tutorial.
Support
Connect an NI CompactRIO Controller to a Wireless Network
Gain the freedom of placing your National Instruments CompactRIO controller practically anywhere without the need for a long Ethernet cable running from a router. In this discussion thread, learn about required network equipment and the six steps needed to connect your controller to a wireless router - no hardware modifications required.
Read more.
Adjust MAX Driver Settings for USB Compatibility with NI-DAQmx
Learn how to change your driver settings in National Instruments Measurement & Automation Explorer (MAX) to ensure compatibility between your USB devices and NI-DAQmx and NI-DAQmx Base.
Learn more.
Save NI LabVIEW Data to a Database Instead of Custom XML Files
Stop building your file memory by saving each test/run of your VIs in their custom XML files. Check out this active thread from the NI discussion forum about saving data from National Instruments LabVIEW programs to a database file using the least-expensive and simplest approach.
Go to the discussion board.
Choose the Best Method for Capturing Image Sequences
See what fellow engineers say about the best method for capturing a sequence of nine images in less than one second using an IEEE 1394 (FireWire) camera.
Go to the discussion boards.
Record Magnetic Field Measurements after Program Modifications
Visit the NI discussion forum to read about techniques for recording analog input readings of magnetic field measurements from Hall effect sensor elements while applying current.
Go to the discussion boards.
This e-mail was sent to: stephanie.logerot@ni.com
If you do not wish to receive e-mail from National Instruments, please visit ni.com/remove
Privacy
| Technical Support
| Activate a new e-mail subscription
© 2005 National Instruments Corporation. All rights reserved.
11500 N Mopac Expwy Austin, TX 78759-3504