National Instruments
  NI News  |  Your Global, Customized Source for Company and Product News, Events, and Support  
Top Stories July 25, 2006
Issue at a Glance
Company and Product News
New On-Demand Training from NI
Take a Look Inside the New USB M Series
New Measurement-Ready Options for OEM Designers
NI ECU Measurement and Calibration Toolkit Adds XCP Support
Improving Retinal Disease Treatment with Intelligent DAQ

Development Resources
Tutorial: Technologies for Building Wireless Industrial I/O Systems
Selecting the Right PC for Your PCI Express Hardware
Using DCs for High-Speed RF/IF Streaming
How to Perform a Serial Loopback Test
Embedded Drivers for Linux®, QNX, and VxWorks

Events
Webcast: Automating Lab Instruments with NI LabVIEW
Webcast: Avoiding the 7 Most Common Problems in Switch Programming
Webcast: Creating User-Defined Express VIs
Webcast: Managing Requirements and Developing Large LabVIEW Applications
Industry-Leading Researchers, NI Developers to Speak at NIWeek 2006 Summits

Support
Example Code: ActiveX for Beginners
Example Code: RF Frequency Sweep
Example Code: Creating a Simple Music Synthesizer
Example Code: Delay IMAQ Acquisition
Example Code: Synchronized Analog Input across Multiple NI CompactDAQ Chassis



Of Recent Interest
Most Viewed Content on ni.com
Find Events in Your Area



View NI News Archives



Local Sales Contact Info
Travis Ferguson
Tel: (512) 683-0100
Fax: (512) 683-9411
travis.ferguson@ni.com

Additional Local Contacts




Subscription Preferences
NI News is customized to your product, industry, and content subscription preferences.

Edit Preferernces
Lower Your Test Costs with New Oscilloscope
The new NI PXI-5105 8-channel digitizer, the lowest price-per-channel high-speed data acquisition product in its class, offers a cost-effective alternative to systems that use multiplexed A/D converters or switches to increase channel count. You can use the PXI-5105 60 MS/s, 12-bit digitizer to increase the number of analog input channels in your systems while lowering test costs.
Learn more.
Analog Sensors Get Smart
Sensors can tell you information about virtually anything, from blood pressure to structural problems on interstate highways. Engineers and scientists developing new micro-electro, micromechanical, and wireless technologies are striving to expand the use of sensors into all aspects of life. However, most engineers and scientists using sensors in traditional applications still use the same analog sensors they have used for decades.
Learn more.
Company and Product News
New On-Demand Training from NI
National Instruments recently introduced new benefits for the Standard Service Program (SSP) and Premiere Service Program (PSP). These new features make it easier than ever to stay current with the latest software releases and access resources designed to ensure your success with NI products.
Learn more.

Take a Look Inside the New USB M Series
National Instruments M Series multifunction data acquisition devices deliver an extensive set of features that make them ideal for fast, accurate analog and digital I/O. Built on the same technologies that boosted the popularity of PCI and PXI M Series plug-in DAQ devices, the new NI M Series DAQ devices for USB provide more performance, I/O, and value than other USB data acquisition devices.
Learn more.

New Measurement-Ready Options for OEM Designers
OEM engineers have a wide range of development options, from designing at the component level to optimize cost to developing at the subsystem level to dramatically cut development time. Often, making a good decision on these trade-offs is the difference between profit and loss. For lower-volume OEM designs, "application-ready" subsystems are often used to prototype, get to market quickly, and test market acceptance before starting a cost-optimized custom design.
Learn more.

NI ECU Measurement and Calibration Toolkit Adds XCP Support
The new ECU Measurement and Calibration Toolkit 2.0 extends the National Instruments LabVIEW, LabWindows/CVI, and Microsoft Visual C/C++ development environments to support measurement and calibration applications for designing and validating automotive electronic control units (ECUs). With the latest upgrade, you now can use the toolkit to develop and verify next-generation ECUs with the Universal Measurement and Calibration Protocol (XCP).
Learn more.

Improving Retinal Disease Treatment with Intelligent DAQ
Traditional methods of panretinal laser photocoagulation to treat retinal diseases caused by diabetes have changed little in the past 35 years. Using NI LabVIEW software and intelligent data acquisition (DAQ) hardware, OptiMedica developed a system to improve this treatment, resulting in better precision and improved safety than previous, outdated methods.
Learn more.


Development Resources

Tutorial: Technologies for Building Wireless Industrial I/O Systems
As wireless technology makes inroads in the industrial space with multiple standards, systems integrators are faced with the challenge of selecting the right technology for their applications. See which wireless standards are suited for I/O and sensor networks, controller networks, or SCADA networks. Learn how to interface these wireless standards to your existing systems to build your own wireless industrial I/O systems.
View this tutorial.

Selecting the Right PC for Your PCI Express Hardware
This white paper examines the next generation of the PCI peripheral architecture, PCI Express. Learn about the technology behind PCI Express and issues to consider when purchasing a PC with a PCI Express peripheral architecture.
Learn more.

Using DCs for High-Speed RF/IF Streaming
An integral part of many RF/IF communications systems is a digital downconverter (DC). To understand the function of the DC, look at a typical RF system. This system may involve multiple analog upconversion and downconversion stages that convert the signal from radio frequency (RF) to intermediate frequency (IF) and vice versa.
Learn more.

How to Perform a Serial Loopback Test
Learn how to perform a loopback test, where you can send and receive data from the same serial port to verify that the port is operational. To perform this test, you need to modify your null-modem serial cable temporarily so that the transmit and receive pins are connected.
Learn more.

Embedded Drivers for Linux®, QNX, and VxWorks
Although data acquisition I/O vendors invest several man-years developing high-quality, easy-to-use driver software, sometimes embedded system developers need even more flexibility. To offer this flexibility when vendors add I/O to their choices of embedded hardware and OS, National Instruments provides the NI Measurement Hardware DDK (Driver Development Kit). Linux® is a registered trademark of Linus Torvalds in the U.S. and other countries.
Learn more.


Events

Webcast: Automating Lab Instruments with NI LabVIEW
Learn how to easily automate your instruments as well as build custom software for your experiments with LabVIEW by viewing three applications. The first shows how to create a PC-based system for taking accurate pH measurements. The second shows an automated test tube inspection that reduces errors and tedious monitoring. The last example discusses controlling a sample preparation system that has multiple variables.
View this Webcast.

Webcast: Avoiding the 7 Most Common Problems in Switch Programming
See how the latest NI Switch Executive features simplify the configuration and programming of ultrahigh-density switching applications. Learn how to set up IVI switches in Measurement & Automation Explorer (MAX), configure channels, integrate multiple modules, create route groups, and validate your entire switch application.
View this Webcast.

Webcast: Creating User-Defined Express VIs
If you design code for colleagues or customers to use, this Webcast on Demand can help you create high-quality, easy-to-use code for your end users. This session demonstrates how to create professional-quality Express VIs that incorporate interactive preview panes to display data at development time, as well as how to design context help for a variety of data types.
View this Webcast.

Webcast: Managing Requirements and Developing Large LabVIEW Applications
Take a closer look at requirements management and how to link your requirements to particular NI LabVIEW VIs, which gives you traceability from documentation to implementation.
View this Webcast.

Industry-Leading Researchers, NI Developers to Speak at NIWeek 2006 Summits
Learn from visionaries such as Jeff Kodosky, cofounder of National Instruments and inventor of LabVIEW and Dr. Ahmad Bahai, Chief Technology Officer and Fellow, National Semiconductor, and professor at the University of California, Berkeley at the NIWeek 2006 summit keynotes. Sessions include "Graphical Design Holds the Key to Boosting Productivity," "The Roadmap to Ubiquitous Wireless Connectivity," and many more.
Learn more.


Support

Example Code: ActiveX for Beginners
This VI is a simple program using ActiveX controls to access data in an Excel file. The VI opens a spreadsheet to a specific sheet, reads a particular cell, and returns the cell's value to LabVIEW.
Download this example.

Example Code: RF Frequency Sweep
This example demonstrates how to generate a frequency sweep at a specified power level.
Download this example.

Example Code: Creating a Simple Music Synthesizer
This example program uses the Beep VI included in LabVIEW to create the sounds specified on the keyboard. You can customize the note length and scale octave using the front panel controls.
Download this example.

Example Code: Delay IMAQ Acquisition
This VI acquires images at full frame rates but delays the display. Delaying the display might be useful in situations where the item you are inspecting is far away from you, and you want to delay the display of the image until the item is closer.
Download this example.

Example Code: Synchronized Analog Input across Multiple NI CompactDAQ Chassis
This example demonstrates how to synchronize the analog inputs on two different NI CompactDAQ chassis using control signals from digital I/O modules. It uses the LabVIEW Sound and Vibration Toolkit VIs for phase comparison.
Download this example.



This e-mail was sent to: stephanie.logerot@ni.com
If you do not wish to receive e-mail from National Instruments, please visit ni.com/remove Privacy   |  Technical Support   |  Activate a new e-mail subscription


© 2006 National Instruments Corporation. All rights reserved.
11500 N Mopac Expwy Austin, TX 78759-3504