Cut the Wires, Cut the Cost

	July 21, 2009
Your Source for Measurement and Automation News, Events, and Developer Resources		ni.com/contact

In This Issue

Cut the Wires, Cut the Cost		Three Mil/Aero Test Trends

Reduce installation costs, save time, and eliminate wiring while solving new application problems using a wireless monitoring system. Learn more »		Learn about three trends challenging the mil/aero industry and how major companies are addressing them with NI products. Read article »

Developer Resources

Data Management Technology Basics
Learn about the NI technical data management technologies that can help you store, manage, and process your test data.
Learn more »

11 Shocking Green Engineering Numbers
Discover 11 statistics that prove green engineering and affordable energy are the key technical challenges of the current times.
Read article »

Webcast: GPS Simulation Fundamentals
Learn the basic setup for GPS receiver testing and the pros and cons of using an NI GPS simulator versus a record-and- playback test solution.
View webcast »

Example Code: Teasing Homer Simpson
Download this example code to tease Homer Simpson by turning the mouse cursor into a doughnut that his eyes follow around the screen.
Download code »

New Products and Technologies

Video: Virtualization in the Engineering World
Watch Jim St. Leger of Intel Corporation explore the economic benefits of virtualization technology and how engineers can take advantage of it while maintaining real-time performance.
Watch video »

Advanced Data Management Capabilities with DIAdem 11.1
Learn how you can use NI DIAdem 11.1 to add advanced data visualization and data management features to high-volume applications and large group development projects.
Learn more »

Custom Data Acquisition with NI R Series DAQ
Exceed the capabilities of traditional data acquisition hardware with new NI R Series multifunction RIO data acquisition (DAQ)devices.
Read article »

F-RAM Memory Validation and Debugging with NI PXI and Modular Instruments
See how engineers at Ramtron International created a flexible, cost-effective ferroelectric RAM (F-RAM) test system as an alternative to existing automated test equipment.
Read case study »

Events and Training

NIWeek 2009 Is Only Two Weeks Away
Time is running out to register for the National Instruments worldwide graphical system design conference, August 4-6, in Austin, Texas. Learn more about the conference, register, and create your personalized list of sessions now.
Register now »

Evaluation Quiz: Test Your LabVIEW Skills
Find out which NI training option is best for you by assessing your skills with the LabVIEW evaluation quiz.
Take quiz »

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Community Highlight
Control Fireworks with LabVIEW
This Waterloo Labs do-it-yourself video shows fireworks synchronized to music using LabVIEW and an NI USB-6009 data acquisition device.
Watch video »

IP Corner
LabVIEW FPGA RF Communications Library
Download VIs for modulation, demodulation, filtering, pulse shaping, resampling, carrier tracking and recovery, and channel coding and decoding in the new RF Communications Library.
Download code »

NI in the Press

Generate Profits through Test »

Wireless and Energy Take the Lead »

Embedded Vision System Features Multicore Processing for Multiple Cameras »

Segway Inventor to Be NIWeek Speaker »

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