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Top Stories May 16, 2006
Issue at a Glance
Company and Product News
NI CompactDAQ Under the Hood – Three Technologies That Drive USB Performance
Download More than 5,000 Instrument Drivers
Intelligent DAQ Transforms High-Precision Laser Control
GigE Vision Cameras Now Supported by NI Vision Acquisition Software
NI Logic Analyzers Simplify Connectivity, Analysis, I/O

Development Resources
Tutorial: LabVIEW Tips and Tricks for Creating Better Instrument Drivers
High-Speed Digital I/O and Logic Analyzer Fundamentals
Hot NI Discussion Forum Topics: LabWindows/CVI
All About Switching
Tutorial: Tips for Developing Extended-Duration Tests

Events
Webcast: Implementing High-Performance IP in FPGA-Based COTS Prototypes
Webcast: PXI for Semiconductor Tests
Webcast: What's New in LabVIEW 8
Learn the Latest Control, Monitoring Technologies for Oil and Gas Industries
Webcast: Get to Market Faster and Stay There Longer

Support
Example Code: Creating a Basic Word-Recognition Program in LabVIEW
Tables of Thermoelectric Voltages for All Thermocouple Types
Example Code: Capturing Keyboard Events from a Keyboard or Scanner



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Increase Performance 5X with New USB DAQ Devices
The NI USB-6251 and USB-6259 data acquisition (DAQ) devices, the first NI M Series DAQ devices for the USB bus, offer up to 32 analog input channels and data acquisition rates of up to 1.25 MS/s. These external devices feature the same high-performance M Series capabilities but add the simplicity of USB plug-and-play connectivity as well as new high-speed NI signal streaming technology.
Learn more.
LabVIEW and PXI Enhance Communications Design, Test
To meet the demands of accelerated product development cycles, a flexible, software-based architecture is essential to rapidly prototype, design, and test devices using wireless and communications technologies. By stepping through a simplified functional block diagram of a typical communications system, you quickly learn how to use National Instruments LabVIEW, the NI Modulation Toolkit for LabVIEW, and the PXI RF hardware platform to design and test these devices.
Learn more.
Company and Product News
NI CompactDAQ Under the Hood – Three Technologies That Drive USB Performance
Over the past decade, USB has emerged as a viable, if not preferred, bus option for PC-based data acquisition systems. Two of the most desirable features for any data acquisition system are high data throughput and ease of use. NI CompactDAQ, the latest in USB data acquisition, addresses both of these through analog input data transfer rates up to 3.2 MS/s in a USB-based platform with plug-and-play, hot-swappable module installation.
Learn more.

Download More than 5,000 Instrument Drivers
2006 marks a milestone in NI history – the NI Instrument Driver Network, the industry's largest source for instrument drivers, has expanded to more than 5,000 drivers.
Learn more.

Intelligent DAQ Transforms High-Precision Laser Control
Using the NI LabVIEW FPGA Module and R Series intelligent DAQ hardware, Microfluidics devised a system capable of performing calculations for highly accurate and precise perforation of microfluidic structures. This solution provides the company with a cost-effective method for controlling a large number of valves on a miniaturized card for performing microfluidic operations.
Learn more.

GigE Vision Cameras Now Supported by NI Vision Acquisition Software
National Instruments has adopted the new Automated Imaging Association (AIA) standard for Gigabit Ethernet (GigE) Vision. With NI Vision Acquisition software, engineers can acquire images from thousands of different cameras and seamlessly move among standard vision buses including IEEE 1394a, IEEE 1394b, Camera Link, and analog.
Learn more.

NI Logic Analyzers Simplify Connectivity, Analysis, I/O
When debugging and validating digital systems, engineers usually rely on multiple instruments to acquire, generate, and test digital signals. National Instruments now offers a logic analyzer and pattern generator solution that provides a versatile, compact digital I/O system for designing, testing, and debugging digital ICs and electronics.
Learn more.


Development Resources

Tutorial: LabVIEW Tips and Tricks for Creating Better Instrument Drivers
With this tutorial, both novice and experienced users can explore new tools and techniques for quickly developing high-quality native LabVIEW instrument drivers. See the latest instrument driver templates, Web-based development guidelines, and icon art, and learn how to use the VI Analyzer.
View this tutorial.

High-Speed Digital I/O and Logic Analyzer Fundamentals
A wide range of systems and applications incorporate digital devices and signals, so advancing your knowledge of digital fundamentals is important to master many of today's test and automation applications. Learn essential information about digital measurements, the nature of digital signals, and the devices used to generate and analyze these signals.
Learn more.

Hot NI Discussion Forum Topics: LabWindows/CVI
This week, posters in the NI discussion forums want to know how to create a DLL for LabVIEW from a CVI driver, how to call a .m file from inside a MathScript node, and more.
Visit the discussion forums.

All About Switching
Review the basics of relays, explore switching considerations, and read technical documents about switching applications. Find out how National Instruments switches can greatly improve your test and measurement applications.
Learn more.

Tutorial: Tips for Developing Extended-Duration Tests
During this technical presentation, learn how to improve the design and implementation of extended-duration tests. Discover how to increase the reliability of important test systems with techniques to handle errors effectively while maintaining data integrity, and see why real-time operating systems are ideal for autonomous tests.
Take this tutorial.


Events

Webcast: Implementing High-Performance IP in FPGA-Based COTS Prototypes
Decrease your time to prototype by 10 times through the integration of FPGA from C-based tools, such as the Celoxica DK Design Suite, into LabVIEW FPGA.
View this Webcast.

Webcast: PXI for Semiconductor Tests
Explore the world of semiconductor test with an emphasis on IC characterization. Discover the challenges and concerns facing the industry along with the essential technologies NI provides for effectively dealing with them.
View this Webcast.

Webcast: What's New in LabVIEW 8
Learn about the new features for test, measurement, and control applications in LabVIEW 8, the latest version of NI LabVIEW. These include new tools and features for code management, team-based development, troubleshooting, code distribution to other PCs, benchtop instrument control, and deployment to LabVIEW Real-Time and other LabVIEW targets.
View this Webcast.

Learn the Latest Control, Monitoring Technologies for Oil and Gas Industries
Attend this summit to learn about the latest control and monitoring technologies for oil, gas, and energy applications. Hear firsthand from National Instruments customers and collaborating companies deploying programmable automation controllers (PACs), the next generation of PLCs. Explore ways to solve complex drilling control application challenges and take advanced downhole measurements, and learn about high-performance measurements for compressor condition monitoring from upstream to downstream.
Learn more.

Webcast: Get to Market Faster and Stay There Longer
By providing competitive, quality discount pricing and top-notch application support, National Instruments is a leading worldwide OEM supplier of data acquisition, GPIB, and other measurement and automation products. Learn about the steps NI has taken to meet OEM needs, as well as the advantages to collaborating with National Instruments for OEM applications.
View this Webcast.


Support

Example Code: Creating a Basic Word-Recognition Program in LabVIEW
This VI implements a basic word-recognition algorithm where you record Word 1, Word 2, and a test word that matches one of the first two words. LabVIEW uses the word-recognition algorithm to determine which of the first two words matches the test word.
Download this example.

Tables of Thermoelectric Voltages for All Thermocouple Types
Explore tables with the output voltages for J, K, T, S, B, E, R, and N thermocouple (TC) types over a range of temperatures in 5 °C increments. In each case, the TC reference temperature is 0 °C. The first-named material will be the positive terminal.
Learn more.

Example Code: Capturing Keyboard Events from a Keyboard or Scanner
This VI captures keyboard events and displays both the decimal code and the ASCII character representation of each event. Use this VI with a bar code keyboard wedge scanner that passes data through the keyboard interface on a PC.
Download this example.



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