National Instruments
  NI News  |  Your Global, Customized Source for Company and Product News, Events, and Support  
Top Stories April 4, 2006
Issue at a Glance
Company and Product News
Flexible, Modular I/O – From Handheld USB to Industrial CompactRIO
Unprecedented Dynamic Performance, Flexibility Now Available in PCI
New LabVIEW Control Design Toolkit Shortens Development Time
Increase Your Productivity with NI SignalExpress Tektronix Edition
NI CANopen Library Extends Industrial Connectivity for LabVIEW

Development Resources
Tutorial: Bus Technologies for Test and Measurement Systems
Laptop Control of PXI over Ethernet
Synchronizing Your Measurements or Vision Applications with Popular Drives
Tutorial: Basics of LabVIEW Embedded Module for ADI Blackfin
Quickly Connect to Databases with LabVIEW Database Connectivity Toolkit

Events
Webcast: Simple, Complete USB Data Acquisition
Webcast: Hybrid PXI and VXI Systems
Webcast: Managing Application Development with the LabVIEW Project
Webcast: Power Consumption with Real-Time USB Measurement Tools
Learn About PXI Through Hands-On Demos and More

Support
LabVIEW 8.0.1 Update Available
Example Code: Scalable Multidevice Synchronization with M Series DAQ
Example Code: Combined Measurements with NI PXI Modules and Digitizers
Example Code: Scale an IMAQ Image



Of Recent Interest
Most Viewed Content on ni.com
Find Events in Your Area



View NI News Archives



Local Sales Contact Info
Travis Ferguson
Tel: (512) 683-0100
Fax: (512) 683-9411
travis.ferguson@ni.com

Additional Local Contacts




Subscription Preferences
NI News is customized to your product, industry, and content subscription preferences.

Edit Preferernces
NI LabVIEW Deploys to ADI Blackfin Processors
The NI LabVIEW Embedded Module for ADI Blackfin Processors extends the LabVIEW graphical dataflow development environment to directly target high-performance, low-power Blackfin Processors for faster embedded system development.
Learn more.
Six Key Machine Control Challenges Solved
Cutting-edge technologies in control systems, software architectures, and electromechanical components differentiate the automation system of your next-generation machine from the competition. This article explores the top software and hardware challenges machine builders today face and offers a performance-driven approach to meeting these challenges.
Learn more.
Company and Product News
Flexible, Modular I/O – From Handheld USB to Industrial CompactRIO
Today's engineers are challenged to test all aspects of their products prior to release to ensure performance and reliability. Using modular, flexible platforms, such as National Instruments CompactRIO, you can reprogram a single system to perform several different tests on your product. The NI CompactRIO platform's open embedded architecture, small size, extreme ruggedness, and reconfigurable capability make it ideal for performing a wide variety of tests in even the most extreme industrial settings.
Learn more.

Unprecedented Dynamic Performance, Flexibility Now Available in PCI
You can use the new PCI version of the National Instruments PXI-5922 flexible-resolution digitizer, also known as a PC-based oscilloscope, to make a wide range of dynamic measurements. The NI PXI-5922 digitizer provides the highest dynamic range of any digitizer on the market.
Learn more.

New LabVIEW Control Design Toolkit Shortens Development Time
As part of the LabVIEW graphical system design platform, the LabVIEW Control Design Toolkit delivers high-performance, real-time implementation and advanced Kalman filtering to help you streamline control system design and final deployment.
Learn more.

Increase Your Productivity with NI SignalExpress Tektronix Edition
Learn about the industry's most seamless oscilloscope-to-PC connectivity solution, NI SignalExpress Tektronix Edition. See how to use USB plug-and-play instrument control with NI SignalExpress software and the new Tektronix DPO4000 Series oscilloscopes and download a 30-day evaluation version. Also, join NI and Tektronix at seven FREE events about validation, compliance, and debugging challenges.
Learn more.

NI CANopen Library Extends Industrial Connectivity for LabVIEW
The new CANopen LabVIEW Library makes it easy for you to create industrial control and measurement applications with connectivity to hundreds of industrial CANopen devices, including motion drives, sensors, and distributed I/O. The new library is a collection of high-level, easy-to-use NI LabVIEW functions that convert high-speed NI Series 2 Controller Area Network (CAN) devices into fully functional CANopen master interfaces.
Learn more.


Development Resources

Tutorial: Bus Technologies for Test and Measurement Systems
This tutorial discusses the technical merits of several bus and platform technologies for use in test and measurement, including GPIB, VME, PCI, USB, Ethernet, and LXI, as well as PXI and VXI.
Learn more.

Laptop Control of PXI over Ethernet
Explore the many possible networking protocols available in National Instruments software to control and monitor a PXI measurement system over Ethernet. You can use these techniques in any networked environment, but this application note pays special attention to applications using a laptop to communicate with the PXI system.
Learn more.

Synchronizing Your Measurements or Vision Applications with Popular Drives
Whether you are designing an automated inspection system for LCD displays or stamping items on a conveyor belt, you need to synchronize your motion controller with data or image acquisition hardware running measurement or vision applications. Learn the fundamentals of synchronization, ways to select the right hardware components to directly connect to popular drives, and the basics of programming these systems in LabVIEW.
Learn more.

Tutorial: Basics of LabVIEW Embedded Module for ADI Blackfin
Learn about the graphical programming methodology that targets the Blackin high-performance, low-power family of processors. Other topics covered in this tutorial include a brief look at the hundreds of optimized Blackfin functions available from within the LabVIEW environment and how to debug an application from within LabVIEW.
Learn more.

Quickly Connect to Databases with LabVIEW Database Connectivity Toolkit
With the LabVIEW Database Connectivity Toolkit, you can quickly connect to local and remote databases and conduct many common database operations without having to perform structured query language (SQL) programming. It readily connects to popular databases, such as Microsoft Access, SQL Server, and Oracle. If you need advanced database functionality and flexibility, the LabVIEW Database Connectivity Toolkit also offers complete SQL capabilities.
Learn more.


Events

Webcast: Simple, Complete USB Data Acquisition
Learn about the NI USB data acquisition system designed with your feedback, including easier configuration and PC interface, more system and user safety, and simpler sensor and signal connectivity, all tied together by the most flexible software in the industry.
View this Webcast.

Webcast: Hybrid PXI and VXI Systems
Explore hardware and software techniques for architecting flexible automated test systems that combine VXI, PXI, and other instrumentation buses. Whether you are integrating best-in-class instruments from multiple platforms or migrating existing automated test systems, you can use the concepts presented here to maximize your flexibility and return on investment.
View this Webcast.

Webcast: Managing Application Development with the LabVIEW Project
Take an in-depth look at the National Instruments LabVIEW Project and how you can use it in software development. Explore deployment techniques as well as practices recommended by National Instruments for managing application development using LabVIEW software, organizing source files, and tracking code changes with source code control.
View this Webcast.

Webcast: Power Consumption with Real-Time USB Measurement Tools
Learn from Texas Instruments and National Instruments engineers about the latest in low-power DSPs and power management using the new Texas Instruments C55x™ Power Optimization DSP Starter Kit (DSK). The C55x™ Power Optimization DSK features built-in National Instruments USB data acquisition and LabVIEW software for real-time power measurements.
View this Webcast.

Learn About PXI Through Hands-On Demos and More
Join more than 20 leading test, measurement, and technology companies in hosting the PXI Technology and Applications Conference. The conference is a series of FREE, full-day events in 15 cities across the United States, Canada, and Mexico featuring informational sessions on the latest PXI platform technologies and roadmaps, case study presentations, hands-on technical training, and networking with industry experts.
Learn more.


Support

LabVIEW 8.0.1 Update Available
Keep your LabVIEW software up-to-date by downloading LabVIEW 8.0.1 today. This document includes complete LabVIEW 8.0.1 maintenance release information, such as a list of the issues the software addresses, installation instructions, and answers to your most frequently asked questions.
Learn more.

Example Code: Scalable Multidevice Synchronization with M Series DAQ
This example program illustrates how to configure more than two data acquisition devices to acquire a finite number of samples in a scalable fashion. The code implements one master device and a variable number of slave devices, making it easily expandable for situations where three or more data acquisition devices are required.
Download this example.

Example Code: Combined Measurements with NI PXI Modules and Digitizers
This example combines NI PXI switch modules and high-speed digitizers in a single VI. You can use any multiplexer in scanning mode with a PXI high-speed digitizer card.
Download this example.

Example Code: Scale an IMAQ Image
This LabVIEW VI opens an image file as an IMAQ image, then changes the image's resolution based on your specified scale factor.
Download this example.



This e-mail was sent to: stephanie.logerot@ni.com
If you do not wish to receive e-mail from National Instruments, please visit ni.com/remove Privacy   |  Technical Support   |  Activate a new e-mail subscription


© 2006 National Instruments Corporation. All rights reserved.
11500 N Mopac Expwy Austin, TX 78759-3504