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MEMS Test System for PXI
Test and characterize the performance of MEMS devices including accelerometers, gyroscopes, microphones, and other MEMS sensors with the following PXI system.
- Source/measure capability from +/- 100V, down to 10 pA of resolution
- High-resolution analog input and output at up to 24 bits
- Up to 200 MHz digital I/O for protocols and control lines
View Test System
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