Microelectromechanical System (MEMS) Device Testing: Overview
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"Using PXI and LabVIEW, we were able to test our iMEMS devices at a fraction of the cost, weight, power consumption, and footprint of our previous ATE system."
- Woody Beckford, Analog Devices
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National Instruments supplies a variety of products for designing test solutions for MEMS accelerometers, gyroscopes, microphones, and other MEMS devices in validation, characterization, and production environments. Learn how you can use PXI and modular instrumentation combined with flexible software such as NI LabVIEW to reduce test costs and improve measurement repeatability. Use the resources (customer case studies, technical tutorials, and example code) on this site to learn how PXI and LabVIEW can help you test your MEMS device.
National Instruments hardware and software products have the following measurement capabilities:
- Positive and negative continuity testing
- Current consumption (IIH, IIL, IDDQ, standby)
- High-resolution analog and multitone audio measurements
- Dynamic performance (SINAD, THD, SNR, SFDR, EOB, PHSN, IMD, ISO)
- Motion and vision integration for shaker tables and external stimuli
Industry Trends
- High growth rate at more than 20% overall per year
- Rapid adoption into consumer electronics
- Strong pressure to reduce test costs as unit volumes rise
- Increasing test complexity to include more external stimuli
- Driving innovation in micromachining technology
NI Benefits
- Mixed-signal, modular test platform with high-performance analog instrumentation
- Advanced signal processing and analysis routines for audio and dynamic measurements
- Broad instrumentation capabilities including motion and vision integration
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