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"With PXI, we developed tests faster to debug and characterize faulty memory chips with more flexibility than our previous automated test equipment in the lab." - Chris Wray - Ramtron International |
National Instruments supplies a variety of products for designing memory test solutions for validation, characterization, and production environments. Learn how you can use PXI and modular instrumentation combined with flexible software such as NI LabVIEW to reduce test costs and improve measurement repeatability. Use the resources (customer case studies, technical tutorials, and example code) on this site to learn how PXI and LabVIEW can help you test your memory device.
National Instruments hardware and software products have the following measurement capabilities:
- Adjustable digital I/O voltages and timing for address, data, and control lines
- Bit error rate testing (BERT)
- Control power supply ramp rates
- Check for open/shorts and other parametric measurements
