NI expands the capabilities of PXI for semiconductor characterization and production test with new modules that increase measurement capability, reduce the cost of capital equipment, and shorten test times for a variety of devices under test. NI is proud to introduce PXI’s most flexible 24-channel digital per-pin parametric measurement unit (PPMU), the highest channel density source measure unit (SMU) with SourceAdapt technology for PXI, and extend the RF performance and capability on the PXI platform.
Combined with the ease of use of NI LabVIEW graphical programming, these new instruments can test a variety of devices including analog-to-digital converters (ADCs)/digital-to-analog converters (DACs), power management ICs, wireless ICs, and microelectromechanical system (MEMS) devices.
Watch this video about SourceAdapt, the technology behind the first digitally controlled SMU
High-Speed Digital I/O
With PPMU
The NI PXIe-6556 high-speed digital I/O and PPMU will deliver digital and parametric measurement in a single module on the PXI platform.
Learn more4-Channel SMUs
The NI PXIe-4141/40 SMUs are high-channel-count, high-speed SMUs with four identical SMU channels per PXI Express slot. The NI PXIe-4141 with SourceAdapt technology is the industry’s first digitally controlled SMU.
Learn moreIndustry’s Highest Performance Vector Signal Analyzer
The NI PXIe-5665 is a high-performance vector signal analyzer with a phase noise of 129 dBc/Hz at 10 Khz offset and a noise floor of -165 dBm/Hz. Learn how you can make high-performance measurements 20X faster than rack-and-stack instruments at a fraction of the cost.
View specs and pricing