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TSSI TD-Scan for National Instruments
  • Reads WGL and STIL scan patterns
  • Facilitates high-speed ATE programming for NI 654x, 5x, and 6x high-speed digital I/O devices
  • Works with NI LabVIEW graphical system design environment
  • Provides flexible test-pattern generation options
  • Features powerful waveform viewer and intuitive graphical interface for interactive editing
  • Offers GUI or batch operation

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Overview

The TSSI TD-Scan tool makes it possible for semiconductor test engineers to import Waveform Generation Language (WGL) and IEEE 1450 Standard Test Interface Language (STIL) simulation vectors into NI PXI digital test systems. These vectors are generated by electronic design automation (EDA) tools and are used to stimulate a fabricated device to verify that its physical implementation matches the results achieved in simulation. The vectors are applied using digital test equipment with capabilities similar to the NI PXI-6552 100 MHz digital waveform generator/analyzer with features such as per-cycle tristating, onboard vector comparison, and clock data delay.

About TSSI

Test Systems Strategies, Inc. (TSSI) is the world's largest leading provider of design-to-test pattern conversion and validation software solutions. Design and test teams of all sizes use TSSI products to save time, cut costs, and dramatically decrease time to market. TSSI provides innovative products and premier services for converting functional and structural simulation data from EDA output formats to automatic test equipment (ATE) program files. The company's revolutionary pattern validation technologies offer design and test teams time and cost savings in pre- and postsilicon test program verification, debugging, and failure analysis. One of the company's major contributions includes the invention of WGL, the de-facto standard for design-for-test (DFT), automatic test pattern generation (ATPG), and tester interface. Learn more about TSSI by visiting www.tessi.com.

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