Semiconductor
Semiconductor technology requirements often outpace the test coverage that traditional ATE provides for analog, mixed-signal, and RF test. Semiconductor test engineers need smarter solutions that address cost, scalability, design, and device challenges.
Semiconductor technology requirements often outpace the test coverage that traditional ATE provides for analog, mixed-signal, and RF test. Semiconductor test engineers need smarter solutions that address cost, scalability, design, and device challenges.
Advantages of the NI Approach
Reduced Cost of Test
A platform-based approach from characterization to production offers cost-optimized, high-performance test solutions for RF and mixed-signal test.
Faster Test
NI semiconductor test customers report 10X improvement in test times while maintaining measurement and performance requirements.
More Accurate Measurements
NI products deliver industry-leading measurement accuracy supported through calibration and system services to ensure long-term performance.
Featured Content
With Semiconductor Test System (STS), Integrated Device Technology (IDT), was able to test a wide range of device types while maintaining high test throughput and scalability for future performance requirements.
To test smart devices, organizations are transitioning from traditional ATE and box instruments to a platform-based approach.
Find out how PXI Digital Pattern Instruments bring semiconductor ATE digital capability to the open PXI platform.