Lab Characterization and Validation

Industry leaders are using a new approach to semiconductor test to meet the latest RF and mixed-signal IC test challenges. With NI’s open, software-defined platform, customers can meet evolving test requirements and manage schedule pressures.

A Smarter Approach to Characterization Test

When ICs were simpler and less integrated, fixed-functionality box instruments were sufficient in the lab. But as test requirements grow with increased integration, so does the need for a broader mix of instrumentation. It is common to find a characterization bench that is overflowing with instrumentation. But space isn’t the only problem. Box instruments are optimized to work independently instead of together; integration over GPIB or Ethernet is not optimal for high data throughput, low latency communication, and tight synchronization. NI’s approach to semiconductor characterization and validation is based on a single underlying platform of PXI and software that you can use from the lab through production. Using this approach, you can improve time to market with the ability to characterize components more quickly while reducing capital equipment costs and improving the efficiency of your team.

PXI Platform Resource Kit

Learn the basics of the PXI platform for semiconductor characterization with architectural notes, relevant case studies, and performance metrics.

Featured Content

Products and Solutions

The NI Alliance Partner Network

The Alliance Partner Network includes more than 1,000 companies that specialize in complete solutions. From products and systems to integration, consulting, and training services, NI Alliance Partners are uniquely equipped and skilled to help solve some of the toughest engineering challenges.