Wafer-Level Reliability

Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.

Semiconductor companies use National Instruments solutions for wafer level reliability.

NI Expertise Overview

As IC manufacturers continue to introduce new and innovative processes with decreasing device geometries, they need to ensure the additional complexity from these changes does not affect the long-term reliability of their ICs. As technologies evolve at a rapid pace, semiconductor manufacturers must increase the amount of reliability data they collect and analyze while decreasing the cost of test. When faced with this problem of more data at a lower cost, many reliability engineers find they cannot solve it using traditional reliability solutions, so they are turning toward modular, flexible solutions that can scale to fit their needs.

Featured Content

Achieve a repeatable and precise test sequence for PMIC test with National Instruments Source Measure Units.
NI SMU Technology Improves Test Execution Compared to Traditional SMUs
The NI PXIe-4135 SMU has a measurement sensitivity of 10 femptoamps and voltage output up to 200 V.

Products and Solutions

The NI Alliance Partner Network

The Alliance Partner Network includes more than 950 companies that specialize in complete solutions. From products and systems to integration, consulting, and training services, NI Alliance Partners are uniquely equipped and skilled to help solve some of the toughest engineering challenges.

Application Resource Kit


PXI 101

Learn the basics of the PXI standard platform for automated test.