DAQ Diagnostic Utility 2.1 - Windows 7 32-bit/7 64-bit/Vista 32-bit/Vista 64-bit/XP 32-bit 20 Ratings | 3.60 out of 5 |   Print

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Product Line: Multifunction DAQ

Version: 2.1

Release date: 11-29-2010

Software type: Utility

Operating system: Windows 7 32-bit; Windows 7 64-bit; Windows Vista 32-bit; Windows Vista 64-bit; Windows XP 32-bit

Description

DAQ Diagnostic Utility 2.1

The DAQ Diagnostic Utility performs a series of tests to verify the basic operations are within the specified tolerances.

Device Detection 
This test verifies the driver and hardware installation by resetting the device and reading various attributes. To pass this test, the device must be properly installed and configured in Measurement & Automation Explorer (MAX). If NI-DAQmx 7.5 or later is not installed, the device does not pass this test and the DAQ Diagnostic Utility stops. If the device is not supported by this utility, testing is aborted.

Calibration 
The DAQ Diagnostic Utility prompts you to perform a self-calibration before it begins testing the various subsystems. NI recommends that you execute this self-calibration; however, it is not required to complete the DAQ Diagnostic Utility. Periodic self-calibration helps to keep measurements accurate and reliable. Environmental factors, such as changes in humidity or temperature, can cause drifting in measurements.

Counter Tests

The following tests verify the basic operation of the counter/timer circuitry.

– CTR Buffered Pulse 
This test generates a continuous pulse train with one counter and measures the pulse train using buffered pulse width measurements on the other counter. A range of pulse widths are tested. To pass this test, the average of the measurements must lie within a specified tolerance of the requested pulse width.

– Single Pulse Generation
This test generates a single pulse with one counter and measures the pulse with the other counter. A range of pulse widths are tested. To pass, each pulse width measurement must lie within a specified tolerance of the requested pulse width.

  Note  These counter tests are performed only on counters 0 and 1. If your device contains additional counters, those are not tested.

Analog Input Tests

  Note  Analog Input tests are not supported on Simultaneous X Series (PXIe-6356/6358/6366/6368) modules and will result in failed tests.

– AI Ground Reference 
This test verifies the basic operation of the analog input circuitry by taking single-point measurements of the internal ground reference voltage. Every gain setting supported by the device is tested. To pass, each measurement must lie within a voltage range that depends on the code width of the device at the particular gain setting.

– AI Voltage Reference 
This test verifies the basic operation of the analog input circuitry by taking single-point measurements of the internal voltage reference. Every applicable gain setting supported by the device is tested. To pass, each measurement must lie within a voltage range that depends on the code width of the device at the particular gain setting.

– AI Finite Sample Clock 
This test verifies the operation of the analog input timing circuitry by performing a finite buffered acquisition. The number of sample and convert clock pulses are measured using counters. Readings are taken from a variable number of analog input channels up to the total number of analog input channels for the device. To pass, the number of sample clock pulses must equal the number of samples per channel specified, and the number of convert clock pulses must equal the number of samples per channel multiplied by the number of channels in the scan list.

– AI Finite Sample Clock Frequency 
This test verifies the operation of the analog input timing circuitry by performing a finite buffered acquisition. The sample clock frequency is measured by the counters. To pass, the sample clock frequency measured by the counters must lie within a specified tolerance of the requested sample clock frequency.

Analog Output Tests

  Note  Analog Output tests are not supported on Simultaneous X Series (PXIe-6356/6358/6366/6368) modules and will result in failed tests.

– AO Finite Sample Clock 
This test verifies the operation of the analog output timing circuitry by performing a finite buffered waveform generation. The number of AO sample clock pulses is measured using a counter. A range of waveform lengths are tested. To pass, the number of AO sample clocks measured by the counter must be equal to the number of points specified in the finite generation.

– AO Finite Sample Clock Frequency 
This test verifies the operation of the analog output timing circuitry by performing a finite buffered waveform generation. The AO sample clock frequency is measured using counters. A range of AO sample clock frequencies is tested. To pass, the AO sample clock frequency measured by the counters must lie within a specified tolerance of the requested AO sample clock rate.

– AO Single Point 
This test verifies the basic operation of the analog output circuitry by generating single-point voltages and internally reading them back. A range of voltages is tested. To pass, each measurement must lie within a voltage range that depends on the analog input code width.

– AO Accuracy 
This test verifies the operation of the analog output circuitry by performing a finite buffered waveform generation of a sine wave pattern. The voltage is internally read back using the AO sample clock to time the acquisition. To pass, the average error of all measurements must be less than a specified tolerance.

Digital I/O Tests

– DIO Lines 
This test verifies the operation of the digital I/O circuitry by performing line input and output. A Boolean value is written to each digital line and then internally read back. Both True and False values are tested. To pass, each value read must match the value written. If the digital lines support tristating, the test will verify the tristated line is at the appropriate level.

– DIO Ports
This test verifies the operation of the digital I/O circuitry by performing port output and input. A binary pattern of walking 1s and 0s is written to each digital port and then internally read back. To pass, each pattern read must match the pattern written.

Installation Instructions

Requirements for the DAQ Diagnostic Utility

To use the DAQ Diagnostic Utility, you need the following:

  • NI-DAQmx 8.3 or later
  • LabVIEW 2009 SP1 Run-Time Engine (installed with the DAQ Diagnostic Utility)

How to Use the DAQ Diagnostic Utility

To begin testing your device, complete the following steps:

  1. Open the DAQ Diagnostic Utility.
  2. Select your device from the drop-down list.
  3. Click Begin Diagnostic Utility to start the series of tests.

How to Install the DAQ Diagnostic Utility

Download and run DAQ Diagnostic Utility Installer.exe

If you already have the LabVIEW 2010 Run Time Engine installed, download and run the DAQ Diagnostic Utility.exe

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