Table Of Contents

History RAM View

Last Modified: July 22, 2019

Use this view to see the History RAM results for the flow of pattern execution for the last pattern burst across all executed patterns for the number of samples you specify in the Instrument Settings pane, including vectors with repeat opcodes. The view also includes the corresponding time sets, labels, opcodes, pattern names, vectors/cycles, pin state data, and comments. Rebursting a pattern overwrites the data in the History RAM View.

The digital pattern editor automatically displays the History RAM View when the Overlay Last History RAM Results button Overlay History RAM Results is disabled and the digital pattern instrument returns History RAM results for any site of the pattern burst. Click the Show History RAM View button Show History RAM View on the toolbar or select View»History RAM to launch the History RAM View.

The Digital Pattern Editor collects results for all enabled sites. Refer to the specifications document for the digital pattern instrument for more information about the number of samples supported in History RAM. Use the Site drop-down menu on the toolbar to select the site for which you want to view results. Click the Enabled Sites button Enabled Sites to launch the Sites dialog box, which you use to enable and disable sites defined in the active pin and channel map, typically for debugging purposes.

Viewing Results

The Passed/Failed/Disabled indicator displays whether the last pattern burst includes any failures, regardless of what you log to History RAM, and whether the site was disabled for the last burst of the pattern. Disabled sites do not return results. The Total Failures indicator displays the number of failures in the pattern. The Burst Complete indicator displays the timestamp of when the last pattern burst completed. Pin state data cells with a red background and red text indicate a failure.

Column heading tooltips display the total number of pin failures for the pattern burst for each pin and the number of failures for the pin recorded in History RAM results in parentheses. Cell tooltips display expected and actual values for failures. Pin state data cells with an asterisk indicate that no data was available for the cycle. This can happen when pins are mapped to multiple instruments with History RAM configured only to capture failures or to trigger on failure. Each instrument independently captures the History RAM results and not all instruments capture the same samples when capturing failures because each instrument only considers the failures on that particular instrument. The same rationale applies for triggering on failure. Use the navigation buttons on the toolbar to move among the first, previous, next, and last failures in History RAM overlay mode. Expand a pin group to navigate to the individual pins in the group.

Click the Find in Pattern button Find on the History RAM View toolbar or press <Ctrl+F> to launch a dialog box in which you can specify the text you want to search for. The History RAM View highlights cells that include the search text. Use the Find Previous and Find Next buttons in the dialog box or on the History RAM View toolbar to navigate among the results. If you close the Find in Pattern dialog box, you can continue to browse through results by selecting Shift»F3 to see previous results or F3 to see the next results.

Right-click a pin state cell in the History RAM View and select Use Digital Scope on Selected Pins and Cycles from the context menu to launch the digital scope, which displays a 2D plot of the actual waveform using the pattern, timing set, and levels.

Saving Results

Click the Save History RAM Results button Save History RAM Results on the History RAM View toolbar or press <Ctrl+S> to save all the History RAM results in the view in a .csv file. The file displays the results for each cycle in a row and a separate column for the actual and expected pin states for each pin, including pins from pin groups.

Click the Save as Pin Failures List button Save Pin Failures on the History RAM View toolbar to save a list of only the pin failures in a .csv file. The file displays the results for each failure in a separate row with columns that show the cycle and pin at which the failure occurred and the actual and expected pin state results.

You can also select and copy values from the History RAM View to paste into another application.

Keyboard Shortcuts within History RAM View

Action Shortcut
Find in pattern <Ctrl+F>
Find next F3
Find previous <Shift+F3>
Save all History RAM results in the view in a .csv file <Ctrl+S>

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