NI Digitizers: Awards, Customer Solutions & Quotes
Table of Contents
NI PXI-5922 Flexible-Resolution Digitizer Awards & Honors
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2006 Test Product of the Year winner Test & Measurement World [Read Press Release] |
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Hot 100 Products of 2005 winner Electronic Design News [Read Press Release] |
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Innovation of the Year finalist Electronic Design News [Read Press Release] |
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Engineering Award finalist Product Design & Development |
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Electron D'or 2005 Award winner Electronique |
Learn more about the NI 5922 Flexible-Resolution Digitizer
Customer Quotes
| "The PXI-5124 high-resolution digitizer is a key component in the Xbox 360 controller end-of-line functional test system. The 200 MS/s real-time sampling rate and 12 bits of resolution on the PXI-5124 digitizer helped us verify the signal integrity of the USB communication between the controller and the Xbox 360 console with confidence. The high-resolution input and high-speed sampling rate are important features that make the digitizer a low-cost, quality solution – and a better option compared with higher-cost and lower-resolution oscilloscopes – to capture, monitor, and analyze the Xbox 360 controller USB signals,audio signals, and serial data signaling." [Read complete customer solution]
- D.J. Mathias, Microsoft Corp.
“We chose the NI PXI-5922 flexible-resolution digitizer because of its unprecedented dynamic range, which we use to measure settling time accurately by filtering out the noise. This is the only product on the market with high input impedance and wide dynamic range that we can easily configure and control with NI LabVIEW, which helps us reduce our product development time.”
- Eoin English, Design Evaluation Engineer, Analog Devices - Douglas Jackson, Research Engineer, University of Louisville
"We chose the 14-bit, 100 MS/s PXI-5122 digitizers to meet our 50 MS/s sampling rate and high-accuracy requirements. The PXI-based high-resolution digitizers greatly improved our measurement test results and data throughput, giving us a more complete characterization of the performance of our surge arresters."
- Stephan Hoffarth, Head Test Engineer, ABB Surge Arresters in Switzerland - Alex Chang, Senior Test Engineer, Askey - Ed Coleman, Hardware Engineer-Consultant, Lexmark International - In-Seung Yang, Samsung Electronics - Deepak Murji, Senior Test Engineer, Baxall Ltd - Michael Mainds, Senior Development Engineer, Baxall Ltd - Mr. Wang Guozheng, General Manager, Suntek |
Customer Solutions
Microsoft Uses NI LabVIEW and PXI Modular Instruments to Develop Production Test System for Xbox 360 Controllers
Lexmark Improves Measurement Accuracy of Ink Cartridge Test
Samsung Uses NI LabVIEW and Modular Instruments to Reduce Development Time
Creating a Test System for a New Generation Ultrasound Machine with LabVIEW and PXI
Askey Automates Testing of Set-Top-Box with NI Modular Instrumentation
PXI-Based Oscilloscope Breaks New Ground in Real-Time Monitoring
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