Semiconductor technology requirements often outpace the test coverage that traditional ATE provides for analog, mixed-signal, and RF test. Semiconductor test engineers need scalable solutions that address cost, design, and device challenges.

Advantages of the NI Approach

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Reduced Cost of Test

A platform-based approach from characterization to production offers cost-optimized, high-performance test solutions for RF and mixed-signal test.

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Faster Test

NI semiconductor test customers report 10X improvement in test times while maintaining measurement and performance requirements.

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More Accurate Measurements

NI products deliver industry-leading measurement accuracy supported through calibration and system services to ensure long-term performance.


Featured Content

The PXI-based NI Semiconductor Test System (STS) combines modular instrumentation and system design software for RF and mixed-signal production test.
Smarter Devices Require Smarter Test Systems
Find out how PXI digital pattern instruments bring semiconductor ATE digital capability to the open PXI platform.