NI PXI Semiconductor Suite
The NI PXI Semiconductor Suite consists of 10 new products that expand the capabilities of PXI and NI LabVIEW for software-defined chip test systems. The suite provides digital instrumentation up to 200 MHz, DC parametric measurements down to 10 pA, faster RF tuning times, a high-speed digital signal insertion switch, and the ability to import Waveform Generation Language (WGL) and Standard Test Interface Language (STIL) vector formats directly into PXI. These new instruments expand the existing capabilities of PXI and LabVIEW to offer a flexible, mixed-signal test platform for a variety of semiconductor devices in validation, characterization, and production environments. HardwareNI PXI-4132 Precision Source Measure Unit (SMU)
Explore Features | Watch Demonstration | View Specifications NI PXIe-6544/45 and NI PXIe-6547/48 100 and 200 MHz High-Speed Digital I/O
Explore Features | Watch Demonstration | View Specifications NI PXIe-5663E 6.6 GHz Vector Signal Analyzer and NI PXIe-5673E 6.6 GHz Vector Signal Generator
Explore Features | Watch Demonstration | View Specifications for the NI PXIe- 5663E | View Specifications for the NI PXIe-5673E NI PXI/PXIe-2515 High-Speed Digital Signal Insertion Switch
Explore Features | Watch Demonstration | View Specifications SoftwareWGL/STIL Test Vector Importing
Explore Features | Watch Demonstration | View Specifications |
Measure current with down to 10 pA resolution, and better than 100pA resolution at rates up to 1kHz, with advanced sequencing and triggering capabilities for high-speed, high-accuracy measurements on ICs.
Generate or acquire digital I/O up to 200 MHz on up to 32 channels with advanced features including real-time bit comparison and enhanced timing control for interfacing to a chip.
Perform fast, multiband RF measurements using RF List Mode to sweep through a pre-configured list of power levels and frequencies on wireless and mixed-signal ICs.
Switch in precision DC instrumentation including SMUs and DMMs on up to 32 digital I/O lines for leakage current and other parametric measurements on a chip.
Import WGL and STIL test vector formats for use with NI-HSDIO instrumentation using TSSI TD-Scan for National Instruments software.