Watch the Demos
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DC Parametric Measurements with the NI PXI-4132 Precision SMUSee the configuration of a PXI-based system that performs DC parametric measurements on a packaged semiconductor chip. By using the PXI-4132 precision source measure unit (SMU) along with the NI PXI-2515 high-speed digital signal insertion switch, you can achieve accurate voltage and current measurements at high reading rates. With down to 10 pA measurement sensitivity, and typical sensitivities better than 100 pA at rates more than 1 kHz, the PXI-4132 precision SMU can improve both the speed and reliability of automated measurements in semiconductor applications. |
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Advanced Digital Testing with the NI PXIe-6547/48Learn how to test dynamic, linear, and parametric characteristics of a 200 MS/s digital-to-analog converter (DAC) with the new NI PXIe-6548. Higher clock rates, selectable voltage levels, and an onboard high-resolution clock make the NI PXIe-6548 ideal for testing DACs, analog-to-digital converters (ADCs), and a variety of other semiconductor chips. These features combined with superior synchronization capabilities make NI modular instruments an ideal solution for chip testing. |
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Using RF List Mode for Multiband RF MeasurementsToday, RF engineers face increasing pressure to reduce measurement time without sacrificing accuracy or repeatability. With new signal generator and analyzer features such as RF List Mode, engineers can reduce measurement times of multiband devices. In the following webcast, learn more about RF List Mode. |
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Import WGL/STIL Files with the TSSI TD-Scan for National InstrumentsDiscover how to use a Waveform Generation Language (WGL) vector format using the TSSI TD-Scan for NI software and NI high-speed digital devices for performing a scan test on a microelectromechanical system (MEMS) accelerometer. Learn how you can use the timing editor to modify timing and I/O information on the WGL file and then generate it on the NI PXIe-6548 for performing a scan test on an MEMS accelerometer. |