This DC parametric semiconductor validation test system is designed to test the DC characteristics of a CMOS semiconductor chip. Here you will find detailed information and example code to perform open and short circuit test, leakage tests, power tests, input voltage threshold test (VIL, VIH), output voltage threshold test (VOH, VOL), and output short circuit test (IOS).
The system hardware consists of a source measure unit (SMU), a matrix switch, and a high-speed digital board inside a PXI chassis. The SMU powers the device under test (DUT) as well as characterizes its current consumption in a variety of states. Additionally, the SMU allows for the testing of parameters on each pin such as open and short connections, voltage thresholds, and leakage currents. The matrix switch provides the connectivity from the SMU to each of the pins on the DUT. Finally, the high-speed digital board provides the interface for communicating with and exercising the DUT.
The system software consists of test code, switch management code, and test management code. The test code is used to configure hardware devices for appropriate measurements. It is also used for data processing and analysis. Each test is written as a separate module. The switch management code configures the high-density switch matrix for measurements by making appropriate connections. Lastly, the test management code organizes individual test code modules and provides a framework for adding more tests in the future.
Once you've explored the diagram, select Architecture Details for more information.